Automated System for Visual Non-Destructive Testing
Galina Nikonova, Aleksandr Nikonov, Yulia Zakirova, Valery Makarochkin

Complex Method for Determining the Technical Condition of Electronic Devices Based on a Cognitive Model, Petri Nets and Artificial Neural Network
Anna Kolodenkova, Svetlana Vereshchagina

Structural and Objective Model for Providing a Given Class of Clean Rooms for Microelectronics
Valery I. Karakeyan, Andrei S. Riabyshenkov, Mikhail A. Gundartcev, Valeria P. Sharaeva, Nikolai R. Kharlamov

The Method of Diagnostics of Radio-Electronic Means Based on the Analysis of Shock Effects by Means of Machine Learning Algorithms
Daniel E. Kondrashov, Saygid U. Uvaysov, Kiya I. Bushmeleva, Petr E. Bushmelev

Suppliers classification process at civil aviation company
Maria V. Andreeva

Signal Shaping with Adjustable Parameters for Measuring Instruments
Galina Nikonova; Aleksandr Nikonov; Pavel Sak

Influence of Node's Reliability Indicators on the Wireless Sensor Network Operability
Konstantin Novikov, Sergey Polesskiy

Software and algorithmic complex for evaluating the efficiency of an automated optical-electronic system
Dmitry Lovtsov, Dmitry Gavrilov

Research of Mathematical Models for Assessing the Pumping Flashtubes Failure Rate
Islam Kunizhev, Pavel Korolev, Ilya Ivanov, Kirill Sedov

Development of the Dependability and Quality Assessment Method for the Design of Wireless Devices
Pavel Korolev, Ilya Ivanov, Anton Sosnin